Test pattern
Beginner
A list of 0s and 1s fed into a chip during testing, along with the answer a good chip should give back.
Novice
One set of input values applied to the chip during test, plus the output values a fault-free chip would produce. A chip passes if every pattern’s output matches.
Expert
In scan test, one load of the scan chains plus primary-input values, one or more capture clocks, and the expected unload, with unknown bits masked. Pattern count times chain length sets most of the test time.
Explained in Design for test (Design Flow).
See also: ATPG (automatic test pattern generation), Shift and capture.