Glossary

Shift and capture

Beginner

The two steps of a scan test: slide a pattern into the chip’s memory cells, then let the chip take one step and catch the result.

Novice

Shift: with scan enable on, clock the chains once per flip-flop in the chain to load a pattern (and push out the previous result). Capture: with scan enable off, give one normal clock tick (two for timing tests) so every flip-flop stores what the logic computed.

Expert

Shift is slow and long (one cycle per bit of the longest chain); capture is a few cycles and may run at full speed. Unloading pattern kk overlaps loading pattern k+1k+1. Shift power and capture power are separate limits.

Explained in Design for test (Design Flow).

See also: Scan chain.

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