Yield learning
Beginner
Finding and fixing the reasons chips fail in the factory, so the share of good chips climbs.
Novice
The work that raises the share of good chips on a new process or design: collect test and inspection data, work out where failing chips are broken, look for causes they share, and change the process or the design.
Expert
Driven by wafer maps, inline inspection, test structures, scan diagnosis of many failing dies, and physical failure analysis. Its speed sets how quickly a product reaches volume and what each good die costs.
Explained in After tapeout (Extras).
See also: Yield, Scan diagnosis, Physical failure analysis (PFA).