Glossary

Scan diagnosis

Beginner

Using a failed chip’s test results to work out where on the chip the flaw probably is.

Novice

Software that takes a failing chip’s wrong outputs, traces them back through the circuit and simulates likely faults, to list where the defect probably is and what kind it is.

Expert

Judged by resolution (how many candidates) and accuracy (whether the real defect is among them). Volume diagnosis correlates results across many failing chips to find systematic yield problems and choose chips for physical failure analysis.

Explained in Design for test (Design Flow).

See also: Yield.

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