Launch-on-capture (LOC)
Beginner
A way to start a speed test with two quick normal steps after the pattern is loaded.
Novice
Also called broadside. Load the first pattern, switch scan enable off, then give two fast normal clock ticks. The first tick makes the flip-flops change to what the logic computed (the second pattern); the second tick catches the result of that change.
Expert
Scan enable has time to settle, so it is easy to implement and close to normal operation. Because the second pattern must be the logic’s own response to the first, some transitions can’t be launched, which costs coverage compared with LOS.
Explained in Design for test (Design Flow).
See also: Launch-on-shift (LOS), At-speed test.