Glossary

Defect density (D₀)

Beginner

How many tiny flaws, like specks of dust, land on each patch of a wafer, on average.

Novice

The average number of fatal manufacturing flaws per square centimeter of wafer. Multiply it by a chip’s area to get the expected number of flaws per chip.

Expert

Falls as a manufacturing process matures, so a new process starts with a higher D0D_0 than an established one. Factories track it layer by layer; in the Poisson model the per-layer yields multiply, so each layer’s contribution can be separated.

Explained in Specification (Design Flow).

See also: Die yield.

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