Glossary

D-algorithm

Beginner

An early method for working out a test pattern that makes a flaw show up.

Novice

The first systematic method for finding a test for a stuck-at fault, published by J. Paul Roth in 1966. It tracks the good and the faulty circuit at once using a symbol D, pushes the fault’s effect toward an output, and works backward to find the inputs needed.

Expert

Five values (0,1,X,D,D‾0, 1, X, D, \overline{D}), where DD means good 1 / faulty 0. It searches over values on internal lines using the D-frontier and the lines still to justify, with implication and backtracking. Complete, but slow on circuits where signals split and rejoin, which PODEM and FAN addressed.

Explained in Design for test (Design Flow).

See also: PODEM, FAN.

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