Glossary

Burn-in

Beginner

Running chips hot and hard for hours, so weak ones fail in the factory instead of in a customer’s hands.

Novice

A stress test: chips run at raised temperature and voltage for hours so that weak ones, which would otherwise fail early in a customer’s product, fail in the factory instead.

Expert

Short burn-in (10–30 hours in the Delft course’s example) targets infant mortality; long burn-in runs hundreds of hours. It is expensive, so its length is balanced against reliability targets.

Explained in Design for test (Design Flow).

See also: Final test (package test).

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