Glossary

Manufacturing defect

Beginner

A flaw made while building a chip, like a speck of dust joining two wires or a wire that comes out broken.

Novice

A physical imperfection introduced while the chip is made: two wires shorted together, a wire broken open, missing or extra material, or a transistor too far off its intended size to work.

Expert

What test is really trying to catch. Fault models are logical stand-ins for defects, and coverage of a fault model only correlates with defect coverage. That gap is why teams add transition, bridging and cell-aware models on top of stuck-at.

Explained in Design for test (Design Flow).

See also: Fault model.

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