Binning
Beginner
Sorting tested chips into grades, like eggs by size, and selling each grade as a different product.
Novice
Putting each tested chip into a category, or bin: failing chips by which test they failed, passing chips by speed, power or how many of their parts work. Faster chips can sell as higher-priced models, and chips with one broken block switched off as cheaper ones.
Expert
Bin limits are written into the test program and come from characterization. Bin counts per wafer and per lot are among the earliest yield signals, and built-in redundancy (spare cores, spare memory rows) turns some failures into lower-grade passes.