Acceleration factor
Beginner
How many times faster a stress test ages a chip compared with normal use.
Novice
How many times faster a stress ages a part than normal use: time to fail in use divided by time to fail under stress. For temperature, the Arrhenius model gives , with temperatures in kelvin, the failure mechanism’s activation energy and Boltzmann’s constant.
Expert
Each failure mechanism has its own activation energy and voltage dependence, so one AF for a whole product is an approximation. Moving across its typical 0.3–1.5 eV range changes the AF by orders of magnitude.
Explained in After tapeout (Extras).
See also: HTOL (high temperature operating life), Bathtub curve.