Glossary

Acceleration factor

Beginner

How many times faster a stress test ages a chip compared with normal use.

Novice

How many times faster a stress ages a part than normal use: time to fail in use divided by time to fail under stress. For temperature, the Arrhenius model gives AF=exp⁡ ⁣[(Ea/k)(1/Tuse−1/Tstress)]\mathrm{AF} = \exp\!\left[(E_{\mathrm{a}}/k)(1/T_{\mathrm{use}} - 1/T_{\mathrm{stress}})\right], with temperatures in kelvin, EaE_{\mathrm{a}} the failure mechanism’s activation energy and kk Boltzmann’s constant.

Expert

Each failure mechanism has its own activation energy and voltage dependence, so one AF for a whole product is an approximation. Moving EaE_{\mathrm{a}} across its typical 0.3–1.5 eV range changes the AF by orders of magnitude.